Online Instrument Tracking
Sign Up   Log In

A2LA Accreditation

The American Association for Laboratory Accreditation (A2LA) is a nonprofit, non-governmental, public service, membership society. The mission of A2LA is to provide comprehensive services in laboratory accreditation and laboratory-related training. Laboratories are accredited in the following fields: Acoustics & Vibration, Biological, Calibration, Chemical, Construction Materials, Electrical, Environmental, Geotechnical, Mechanical, Nondestructive, and Thermal. In addition to these broad fields, specifically-tailored programs are available for animal drugs, automotive electromagnetic compatibility (EMC), environmental lead (Pb), fertilizers, food testing, and putting green materials testing. Aldinger's scope identifies the specific testing or calibration capabilities for which we are accredited.

Dallas, TX Lab - A2LA Accreditation

Go to: Little Rock, AR Lab - A2LA Accreditiation »

SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017 & ANSI/NCSL Z540-1-1994

ALDINGER COMPANY
1440 Prudential Drive
Dallas, TX 75235
Timothy R. Detten    Phone: 214 638 1808

Valid To: June 30, 2022

Certificate Number: 1509.01

In recognition of the successful completion of the A2LA evaluation process, accreditation is granted to this laboratory to perform the following calibrations1:

DIMENSIONAL

Parameter/EquipmentRangeCMC2, 4 (±)Comments
Calipers3, 5Up to 24 in550 µinGage blocks (field)
(24 to 48) in1100 µin
Up to 48 in61 µinGage blocks (lab)
(48 to 96) in1500 µin
Dial and Test Indicators3, 5Up to 3 in99 µinGage blocks, ULM, SuperMic10
Gage BlocksUp to 1 in(3.3 + 1.5L) µinMaster gage block set,
(2 to 4) in(7.7 + 1.5L) µinFederal 130B-24
comparator
(4 to 20) in(7 + 2L) µinMaser gage block set, ULM
Angle Blocks(0 to 90)°0.005°Sine bar and gage blocks
SquaresUp to 18 in99 µinMaster square, amplified gage head
Parameter/EquipmentRangeCMC2, 4 (±)Comments
Height Gages3, 5Up to 48 in280 µinGage blocks (field)
89 µinGage blocks (lab)
Length StandardsUp to 18 in(37 + 1.5L) µinULM/SuperMic10
Up to 48 in(65 + 1.5L) µingage blocks
LevelsUp to 12 in(40 + 14L) µinSurface plate, granite square
Micrometers3, 5Up to 4 in33 µinGage blocks (field)
(4 to 24) in550 µin
(24 to 48) in1100 µin
Up to 4 in15 µinGage blocks (lab)
(4 to 24) in60 µin
(24 to 96) in1500 µin
Plain Ring Gages(0.125 to 12) in(22 + 1.5L) µinULM, gage blocks
Protractors(0 to 90)°0.049°Surface plate, angle blocks
Thread Plugs –
Pitch Diameter(0.040 to 4) in(71 + 1.5L) µinThree-wire method, direct measure
(4 to 12) in(94 + 1.5L) µin
Major Diameter(0.040 to 4) in(19 + 1.5L) µin
(4 to 12) in(35 + 1.5L) µin
Pitch Diameter(0.040 to 12) in(77 + 1.5L) µinTwo-wire method, direct measure
(Taper)
Adjustable Thread Rings6Up to 3.125 in(W) Master PlugSet using master plug gages.
ToleranceASME/ANSI B1.2-1983 and
ASME/ANSI B1.3- 2007
Taper Thread Rings –Up to 3 in120 µinSetting plug, standoff to
Pitch Diametermaster
Thread Wires(4 to 80) TPI(11 + 1.5L) µinMaster thread wire set
Parameter/EquipmentRangeCMC2, 4 (±)Comments
Surface Plates – FlatnessUp to 107 in DL(48 + 0.41DL) µinLeveling system (DL is
and Repeatability3, 5diagonal of the plate)
Indicator Stands(-0.002 to 0.002) in31 µinRepeat reading gage
(-0.002 to 0.002) in45 µinRepeat reading gage,
triangular gage block base
(-0.01 to 0.01) in580 µinIndicator, triangular gage
block base
Optical Comparators3, 5
X-AxisUp to 12 in(250 + 91L) µinGlass scale
Y-AxisUp to 12 in(250 + 91L) µin
Angle(0 to 90)°:0.029°Angle blocks
Rulers3, 5Up to 72 in0.013 inStandard ruler
Tape Measures3, 5Up to 40 in0.013 inStandard ruler
Up to 100 ft0.062 inStandard tape
PI Tapes3, 5Up to 72 in910 µinGage blocks
Radius GagesUp to 0.75 in1300 µinOptical comparator and overlay
Angle GagesUp to 180°0.044°Optical comparator and vernier
Torque ArmsUp to 24 in0.0047 inHeight gage, test indicator
Up to 48 in0.003 inGage blocks
Coating/Electromagnetic Thickness3, 5Up to 120 mils0.25 milsShims

ELECTRICAL - DC/Low Frequency

Parameter/RangeFrequencyCMC2, 7, 13 (±)Comments
AC Current – Measure3, 5
Up to 1 A60 Hz to 1 kHz0.16 % + 0.4 mAHP 34401
(1 to 3) A0.14 % + 1.8 mA
AC Current – Generate3, 5
(29 to 330) µA45 Hz to 1 kHz0.13 % + 0.1 µAFluke 5522A
330 µA to 3.3 mA0.10 % + 0.15 µA
(3.3 to 33) mA0.07 % + 2 µA
(33 to 330) mA0.083 % + 20 µA
(0.33 to 3) A0.10 % + 100 µA
(3 to 10) A0.21 % + 2 mA
(10 to 20) A0.21 % + 5 mA
(16 to 150) A(45 to 440) Hz1 % + 0.25 AUsing 50 turn coil
(150 to 1000) A1 % + 0.9 A
AC Voltage – Generate3, 5
(1 to 330) mV45 Hz to 10 kHz0.018 % + 8 µVFluke 5522A
(0.330 to 3.3) V45 Hz to 10 kHz0.018 % + 60 µV
(3.3 to 33) V45 Hz to 10 kHz0.017 % + 0.6 mV
(33 to 330) V45 Hz to 1 kHz0.023 % + 2 mV
(1 to 10) kHz0.023 % + 6 mV
(330 to 1020) V45 Hz to 1 kHz0.046 % + 10 mV
(1 to 5) kHz0.040 % + 10 mV
AC Voltage – Measure3, 5
Up to 100 mV60 Hz to 3 kHz0.063 % + 40 µVHP 34401
100 mV to 1 V0.063 % + 300 µV
(1 to 10) V0.062 % + 3 mV
(10 to 100) V0.064 % + 30 mV
(100 to 750) V0.075 % + 230 mV
Up to 10 kV0.14 % + 100 mVVitrek 4700 w/ HVL-70
Up to 50 kV0.1 % + 400 mV
Parameter/EquipmentRangeCMC2, 7, 13 (±)Comments
Capacitance – Generate3, 5
Low(0.22 to 3.3) nF0.5 % + 10 pFFluke 5522A
(3.3 to 33) nF0.26 % + 100 pF
(33 to 330) nF0.26 % + 300 pF
(330 to 3300) nF0.26 % + 3 nF
High(3.3 to 33) µF0.4 % + 30 nF
(33 to 330) µF0.45 % + 300 nF
(330 to 3300) µF0.45 % + 3 µF
(3.3 to 110) mF1.1 % + 10 µF
DC Current – Generate3, 5(0 to 330) µA0.015 % + 20 nAFluke 5522A
Up to 3.3 mA0.010 % + 50 nA
Up to 33 mA0.014 % + 250 nA
Up to 330 mA0.010 % + 2.5 µA
Up to 3 A0.038 % + 40 µA
(1.1 to 11) A0.050 % + 500 µA
(11 to 20.5) A0.1 % + 750 µA
(10 to 150) A0.5 % + 0.14 AUsing 50 turn coil
(150 to 1000) A0.5 % + 0.5 A
DC Current – Measure3, 5Up to 10 mA0.075 % + 6 µAHP 34401
(10 to 100) mA0.051 % + 5 µA
100 mA to 1 A0.11 % + 100 µA
(1 to 3) A0.13 % + 600 µA
DC Voltage – Generate3, 5(0 to 330) mV0.002 % + 1 µVFluke 5522A
Up to 3.3 V0.0012 % + 2 µV
Up to 33 V0.0013 % + 20 µV
(30 to 330) V0.0018 % + 0.15 mV
(100 to 1000) V0.0019 % + 1.5 mV
DC Voltage – Measure3, 5Up to 100 mV0.0054 % + 3.5 µVHP 34401
100 mV to 1 V0.0042 % + 7 µV
(1 to 10) V0.0037 % + 50 µV
(10 to 100) V0.0048 % + 600 µV
(100 to 1000) V0.0049 % + 10 mV
Up to 10 kV0.071 % + 30 mVVitrek 4700 w/ HVL-70
Up to 70 kV0.049 % + 200 mV
Parameter/EquipmentRangeCMC2, 13 (±)Comments
Oscilloscopes3, 5
Square Wave AmplitudeFluke 5522A
SC1100
   50 Ω at 1 kHz1 mV to 6.6 V pk-pk0.34 % + 40 µV
   1 MΩ at 1 kHz1 mv to 130 V pk-pk0.25 % + 40 µV
DC Voltage Amplitude
   50 Ω Load(0 to ± 6.6) V0.25 % + 40 µV
   1 MΩ Load(0 to ± 130) V0.05 % + 40 µV
Level Sine Wave
   FrequencyUp to 1100 MHz2.5 parts × 106
   Amplitude50 kHz Reference2.8 % + 300 µV
50 kHz to 100 MHz4.2 % + 300 µV
(100 to 300) MHz4.6 % + 300 µV
(300 to 600) MHz6.4 % + 300 µV
(600 to 1100) MHz7.4 % + 300 µV
   Flatness50 kHz to 100 MHz2.7 % + 100 µV
(100 to 300) MHz3.0 % + 100 µV
(300 to 600) MHz4.6 % + 100 µV
(600 to 1100) MHz5.5 % + 100 µV
Time Markers
   50 Ω Load5 s to 50 ms28 + 1000t µs/st = time in seconds
20 ms to 1 ns3.2 µs/s
   Rise Time – Generate1 kHz to 2 MHz120 ps
(200 to 300) ps
(2 to 10) MHz120 ps
(200 to 300) ps
Electrical Calibration of(-200 to 1371) °C0.56 °COmega CL27 – Type K
Temperature Controllers3, 5
Parameter/EquipmentRangeCMC2, 7, 13 (±)Comments
Resistance – Generate3, 5(0 to 330) Ω0.065 % + 20 mΩFluke 5522A
(330 to 3300) Ω0.029 % + 100 mΩ
(3300 to 33 000) Ω0.029 % + 1.0 Ω
(33 to 330) kΩ0.0037 % + 10 Ω
(330 to 3300) kΩ0.0063 % + 150
(3.3 to 33) MΩΩ 0.026 % + 2500 Ω
(33 to 110) MΩ0.063 % + 3.0 kΩ
(110 to 330) MΩ0.14 % + 100 kΩ
(330 to 1100) MΩ0.14 % + 500 kΩ
Resistance – Measure3, 5Up to 100 Ω0.066 % + 4 mΩHP 34401
100 Ω to 1 kΩ0.031 % + 10 mΩ
(1 to 10) kΩ0.031 % + 100 mΩ
(10 to 100) kΩ0.011 % + 1 Ω
100 kΩ to 1 MΩ0.012 % + 10 Ω
(1 to 10) MΩ0.048 % + 100 Ω
(10 to 100) MΩ0.8 % + 10 kΩ
Electrical Simulation of
RTD3, 5
PT385, 100 Ω(-200 to 0) °C0.058 °CFluke 5522A
(0 to 100) °C0.17 °C
(100 to 400) °C0.12 °C
(400 to 630) °C0.14 °C
(630 to 800) °C0.28 °C
Parameter/EquipmentRangeCMC2 (±)Comments
Electrical Simulation of
Thermocouples and
Indicators3, 5
Type E(-250 to -100) °C0.51 °CFluke 5522A
(-100 to -25) °C0.16 °C
(-25 to 350) °C0.19 °C
(350 to 650) °C0.20 °C
(650 to 1000) °C0.24 °C
Type J(-210 to -100) °C0.28 °C
(-100 to -30) °C0.16 °C
(-30 to 150) °C0.14 °C
(150 to 760) °C0.17 °C
(760 to 1200) °C0.23 °C
Type K(-200 to -100) °C0.33 °C
(-100 to -25) °C0.18 °C
(-25 to 120) °C0.20 °C
(120 to 1000) °C0.24 °C
(1000 to 1372) °C0.40 °C
Type T(-250 to -150) °C0.63 °C
(-150 to 0.0) °C0.24 °C
(0.0 to 120) °C0.16 °C
(120 to 400) °C0.14 °C
Welding Devices3, 5(0 to 350) Amps DC0.87 ADCLoad bank, current
(0 to 100) Volts DC0.012 VDCshunt, DMM
(100 to 700) Feed Rate IPM3.6 IPM

MECHANICAL

Parameter/EquipmentRangeCMC2, 9 (±)Comments
Accelerometers(5 to 9) Hz0.021Back to back
(10 to 99) Hz0.013comparison
(100 to 1999) Hz0.015
(2000 to 10 000) Hz0.02
(10 001 to 15 000) Hz0.025
Parameter/EquipmentRange8CMC2, 9, 12 (±)Comments
Balances3, 5
(0 to 20) g0.11 mgClass 1 weights
(0 to 200) g0.69 mg
(0 to 200) g1.3 mgClass 2 weights
(0 to 1000) g6.6 mg
(0 to 5000) g34 mg
(0 to 20) g0.81 mgClass 4 weights
(0 to 200) g4.8 mg
(0 to 1000) g24 mg
(0 to 5000) g130 mg
(0 to 10 000) g370 mg
(0 to 20 000) g460 mg
Force – Measuring
Equipment3, 5
Tension/CompressionUp to 100 lbf0.0064 lbfClass F weights
w/ load cells
Compression(100 to 1000) lbf0.26 % Indication
(1000 to 10 000) lbf0.24 % Indication
(10 000 to 50 000) lbf0.33 % Indication
(10 000 to 100 000) lbf1.6 % Indication
(50 000 to 500 000) lbf0.4 % Indication
Tension(100 to 1000) lbf0.23 % Indication
(1000 to 10 000) lbf0.23 % Indication
(10 000 to 50 000) lbf0.29 % Indication
Mass, Fixed Points1 mg2.2 µgModified double
2 mg2.1 µgsubstitution
5 mg2.9 µg
10 mg1.4 µg
20 mg1.5 µg
30 mg2.2 µg
50 mg1.6 µg
100 mg1.7 µg
200 mg1.6 µg
300 mg1.6 µg
Parameter/EquipmentRange8CMC2 (±)Comments
Mass, Fixed Points (cont)500 mg2.1 µgModified double
1 g11 µgsubstitution
2 g3.3 µg
5 g5.7 µg
10 g7.2 µg
20 g13 µg
50 g11 µg
100 g39 µg
200 g140 µg
500 g320 µgDirect comparison
1 kg390 µg
2 kg1.7 mg
5 kg2.6 mg
10 kg93 mg
20 kg94 mg
0.8859 g (1/32 oz)12 µg
1.772 g (1/16 oz)94 µg
3.544 g (1/8 oz)240 µg
7.087 g (1/4 oz)170 µg
14.17 g (1/2 oz)170 µg
28.35 g (1 oz)370 µg
56.7 g (2 oz)150 µg
113.4 g (4 oz)740 µg
226.8 g (8 oz)5.1 mg
0.4536 g (0.001 lb)130 µg
0.9072 g (0.002 lb)56 µg
2.27 g (0.005 lb)26 µg
4.54 g (0.01 lb)16 µg
9.07 g (0.02 lb)56 µg
22.68 g (0.05 lb)79 µg
45.36 g (0.1 lb)37 µg
90.72 g (0.2 lb)87 µg
453.6 g (1 lb )3.8 mg
907.2 g (2 lb)7.9 mg
2267.96 g (5 lb)8.3 mg
4535.9 g (10 lb)7.4 mg
9071.8 g (20 lb)94 mg
22 679.62 g (50 lb)95 mg
45 359.237 g (100 lb)0.43 g
90 718.475 g (200 lb)0.43 g
226 796.185 g (500 lb)0.45 g
453 592.37 g (1000 lb)0.47 g
Parameter/EquipmentRangeCMC2, 12 (±)Comments
Optical Tachometer3, 5200 FPM1.3 FPMCalibrated strobe
3000 FPM1.7 FPM
29 999 FPM3.9 FPM
Pressure Measuring(0 to 30 000) psig43 psigAdditel digital test
Equipment – Gages,gauge
Transducers and
Transmitters3, 5(0 to 10 000) psig12 psigCrystal XP2 digital
(0 to 3000) psig3.8 psigtest gauge
(0 to 5000) psig3.9 psigDruck/Martel
(0 to 300) psig0.18 psigtransducer
(0 to 2) in H2O0.0026 in H2ODwyer hook gage
(0 to 300) psig0.04 psigGE/Pace 1003
(0 to 3000) psig0.38 psig
(0 to 10 000) psig1.3 psig
Scales3, 5(0 to 10) lb0.000 25 lbClass 4 weights
(0 to 20) lb0.000 25 lb
(0 to 50) lb0.0063 lbClass F weights
(0 to 100) lb0.0063 lb
(0 to 200) lb0.0064 lb
(0 to 500) lb0.0064 lb
(0 to 1000) lb0.18 lb
(0 to 5000) lb0.19 lb
(0 to 20 000) lb0.21 lb
Torque Wrenches –(10 to 50) in•lbf0.17 in•lbfCDI/Norbar torque
Measure3, 5(30 to 400) in•lbf1.8 in•lbfcalibrator
(80 to 1000) in•lbf5.1 in•lbf
(240 to 3000) in•lbf21 in•lbf
(1200 to 6000) in•lbf23 in•lbfNorbar torque
(2400 to 12 000) in•lbf58 in•lbfcalibrator
Parameter/EquipmentRangeCMC2, 9, 12 (±)Comments
Torque MeasuringUp to 200 in•lbf0.001Torque arm and
Equipment – TransducersUp to 1200 in•lbf0.00091weights
Up to 12 000 in•lbf0.001
Vacuum Measuring(0 to 15) psig0.03 psigDruck DPI 610
Equipment – Gauges3, 5
Rotations Speed –Contact:
Measurement3, 5 Up to 200 RPM1.5 RPMMonarch PLT200
(200 to 3000) RPM2.4 RPM
(3000 to 20 000) RPM11 RPM
Optical:
Up to 3000 RPM1.3 RPM
(3000 to 30 000) RPM3.3 RPM
Indirect Verification ofHRB:
Rockwell Hardness Low1.0 HRBIndirect verification
Testers3,5 Medium0.65 HRB
High0.49 HRB
HRC:
Low0.45 HRC
Medium0.36 HRC
High0.37 HRC
Indirect Verification ofHBW 10/500:Indirect verification
Brinell Hardness Low4.0 HBW
Testers3,5
HBW 10/3000:
High4.8 HBW

FLUID QUANTITIES

Parameter/EquipmentRangeCMC2, 9 (±)Comments
Pipettes3, 5(1 to 50) µL0.31 µLGravimetric method
(50 to 100) µL0.6 µL
(100 to 500) µL1.3 µL
(500 to 1000) µL2.2 µL
(1000 to 5000) µL12 µL
(5000 to 10 000) µL18 µL

THERMODYNAMIC

Parameter/EquipmentRangeCMC2, 12 (±)Comments
Temperature – Measuring(30 to 300) °C0.09 °CHart 1502A/5614
Equipment3, 5(86 to 572) °F0.16 °FPRT in dry block
Temperature – Measuring(-40 to 200) °C0.061 °CHart 1502A/5614
Equipment(-40 to 392) °F0.11 °FPRT in wet bath, in
lab only
Temperature –Measure3, 5(-100 to 600) °C0.64 °CFluke 51 with
(-148 to 1112) °F1.2 °Fthermocouple
(600 to 1200) °C1.1 °C
(1112 to 2192) °F2.0 °F
IR Thermometer3,5(-20 to 150) °C1.1 °CMikron M340 (lab
only)
(Amb + 10 to 400) °C2.1 °COmega BB703
Emissivity ≈ 0.95
Wavelength
(8 to 14) µm
Humidity – Measure &(10 to 90) % RH3.4 % RHSensor Scientific
Measuring Equipment3, 5B13-200

TIME & FREQUENCY

Parameter/EquipmentRangeCMC2, 7, 9, 12 (±)Comments
Frequency – Measure3, 540 Hz to 300 kHz0.014 % IndicationHP 34401
Timers and Stopwatches3, 5Up to 24 hr0.84 s/24 hrReference stopwatch
Stroboscopes3, 5Up to 3600 FPM0.11 FPMUniversal counter
Up to 30 000 FPM0.72 FPM

1 This laboratory offers commercial calibration service and field calibration service.

2 Calibration and Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement that a laboratory can achieve within its scope of accreditation when performing more or less routine calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. Calibration and Measurement Capabilities represent expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory may be greater than the CMC due to the behavior of the customer’s device and to influences from the circumstances of the specific calibration.

3 Field calibration service is available for this calibration and this laboratory meets A2LA R104 – General Requirements: Accreditation of Field Testing and Field Calibration Laboratories for these calibrations. Please note the actual measurement uncertainties achievable on a customer's site can normally be expected to be larger than the CMC found on the A2LA Scope. Allowance must be made for aspects such as the environment at the place of calibration and for other possible adverse effects such as those caused by transportation of the calibration equipment. The usual allowance for the actual uncertainty introduced by the item being calibrated, (e.g. resolution, repeatability) must also be considered and this, on its own, could result in the actual measurement uncertainty achievable on a customer’s site being larger than the CMC.

4 In the statement of CMC, L is the numerical value of the nominal length of the device measured in inches and R is the numerical value of the resolution of the device in microinches unless otherwise noted.

5 The CMC stated for calibrations performed in the laboratory is applicable for calibrations performed in the field.

6 CMC for the Wavetek 9100A is based on 1-year specifications within a temperature range of 23 °C ± 5 °C. Field calibrations will be performed within 23 °C ± 5 °C.

7 CMC for the HP 34401 is based on 1-year specifications within a temperature range of 18 °C to 28 °C. Field calibrations will be performed within 18 °C to 28 °C, 30 % to 55 % humidity.

8 Where ranges are not specified, the CMC stated is for the cardinal points only.

9 In the statement of CMC, percentage (%) refers to percent of reading, unless otherwise noted.

10 "SuperMic" is a registered trade mark with a last listed owner of Pratt & Whitney Measurement Systems, Inc., Connecticut U.S.A.

(A2LA Cert. No. 1509.01) Revised 5/20/2016

This is a marketing version of the official A2LA Scope of Accreditation. It has been modified from the official version to contain the logo of the accredited organization and this modification has been approved by A2LA. The content of the Scope itself has not been altered. The official version of the Scope of Accreditation may be found at: https://www.a2la.org/scopepdf/1509-01.pdf

Service Request

What can we help with?