Aldinger Co. 17025 Accreditation

A2LA Accreditation

The American Association for Laboratory Accreditation (A2LA) is a nonprofit, non-governmental, public service, membership society. The mission of A2LA is to provide comprehensive services in laboratory accreditation and laboratory-related training. Laboratories are accredited in the following fields: Acoustics & Vibration, Biological, Calibration, Chemical, Construction Materials, Electrical, Environmental, Geotechnical, Mechanical, Nondestructive, and Thermal. In addition to these broad fields, specifically-tailored programs are available for animal drugs, automotive electromagnetic compatibility (EMC), environmental lead (Pb), fertilizers, food testing, and putting green materials testing. Aldinger's scope identifies the specific testing or calibration capabilities for which we are accredited.

Dallas, TX Lab - A2LA Accreditation

Go to: Little Rock, AR Lab - A2LA Accreditiation »

Official A2LA Certificate

SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017 & ANSI/NCSL Z540-1-1994

ALDINGER COMPANY
1440 Prudential Drive
Dallas, TX 75235
Timothy R. Detten Phone: 214 638 1808

Valid To: June 30, 2022

Certificate Number: 1509.01

In recognition of the successful completion of the A2LA evaluation process, accreditation is granted to this laboratory to perform the following calibrations¹:

DIMENSIONAL
Parameter/Equipment	Range	CMC^{2, 4} (±)	Comments
Calipers^{3, 5}	Up to 24 in	550 µin	Gage blocks (field)
	(24 to 48) in	1100 µin

	Up to 48 in	61 µin	Gage blocks (lab)
	(48 to 96) in	1500 µin
Dial and Test Indicators^{3, 5}	Up to 3 in	99 µin	Gage blocks, ULM, SuperMic¹⁰
Gage Blocks	Up to 1 in	(3.3 + 1.5L) µin	Master gage block set,
	(2 to 4) in	(7.7 + 1.5L) µin	Federal 130B-24
			comparator

	(4 to 20) in	(7 + 2L) µin	Maser gage block set, ULM
Angle Blocks	(0 to 90)°	0.005°	Sine bar and gage blocks
Squares	Up to 18 in	99 µin	Master square, amplified gage head
Parameter/Equipment	Range	CMC^{2, 4} (±)	Comments
Height Gages^{3, 5}	Up to 48 in	280 µin	Gage blocks (field)

		89 µin	Gage blocks (lab)
Length Standards	Up to 18 in	(37 + 1.5L) µin	ULM/SuperMic¹⁰
	Up to 48 in	(65 + 1.5L) µin	gage blocks
Levels	Up to 12 in	(40 + 14L) µin	Surface plate, granite square
Micrometers^{3, 5}	Up to 4 in	33 µin	Gage blocks (field)
	(4 to 24) in	550 µin
	(24 to 48) in	1100 µin

	Up to 4 in	15 µin	Gage blocks (lab)
	(4 to 24) in	60 µin
	(24 to 96) in	1500 µin
Plain Ring Gages	(0.125 to 12) in	(22 + 1.5L) µin	ULM, gage blocks
Protractors	(0 to 90)°	0.049°	Surface plate, angle blocks
Thread Plugs –
Pitch Diameter	(0.040 to 4) in	(71 + 1.5L) µin	Three-wire method, direct measure
	(4 to 12) in	(94 + 1.5L) µin

Major Diameter	(0.040 to 4) in	(19 + 1.5L) µin
	(4 to 12) in	(35 + 1.5L) µin

Pitch Diameter	(0.040 to 12) in	(77 + 1.5L) µin	Two-wire method, direct measure
(Taper)
Adjustable Thread Rings⁶	Up to 3.125 in	(W) Master Plug	Set using master plug gages.
		Tolerance	ASME/ANSI B1.2-1983 and
			ASME/ANSI B1.3- 2007

Taper Thread Rings –	Up to 3 in	120 µin	Setting plug, standoff to
Pitch Diameter			master
Thread Wires	(4 to 80) TPI	(11 + 1.5L) µin	Master thread wire set
Parameter/Equipment	Range	CMC^{2, 4} (±)	Comments
Surface Plates – Flatness	Up to 107 in DL	(48 + 0.41DL) µin	Leveling system (DL is
and Repeatability^{3, 5}			diagonal of the plate)

Indicator Stands	(-0.002 to 0.002) in	31 µin	Repeat reading gage

	(-0.002 to 0.002) in	45 µin	Repeat reading gage,
			triangular gage block base

	(-0.01 to 0.01) in	580 µin	Indicator, triangular gage
			block base
Optical Comparators^{3, 5}
X-Axis	Up to 12 in	(250 + 91L) µin	Glass scale
Y-Axis	Up to 12 in	(250 + 91L) µin
Angle	(0 to 90)°:	0.029°	Angle blocks
Rulers^{3, 5}	Up to 72 in	0.013 in	Standard ruler

Tape Measures^{3, 5}	Up to 40 in	0.013 in	Standard ruler
	Up to 100 ft	0.062 in	Standard tape

PI Tapes^{3, 5}	Up to 72 in	910 µin	Gage blocks
Radius Gages	Up to 0.75 in	1300 µin	Optical comparator and overlay
Angle Gages	Up to 180°	0.044°	Optical comparator and vernier
Torque Arms	Up to 24 in	0.0047 in	Height gage, test indicator

	Up to 48 in	0.003 in	Gage blocks
Coating/Electromagnetic Thickness^{3, 5}	Up to 120 mils	0.25 mils	Shims

ELECTRICAL - DC/Low Frequency
Parameter/Range	Frequency	CMC^{2, 7, 13} (±)	Comments
AC Current – Measure^{3, 5}

Up to 1 A	60 Hz to 1 kHz	0.16 % + 0.4 mA	HP 34401
(1 to 3) A		0.14 % + 1.8 mA
AC Current – Generate^{3, 5}

(29 to 330) µA	45 Hz to 1 kHz	0.13 % + 0.1 µA	Fluke 5522A
330 µA to 3.3 mA		0.10 % + 0.15 µA
(3.3 to 33) mA		0.07 % + 2 µA
(33 to 330) mA		0.083 % + 20 µA
(0.33 to 3) A		0.10 % + 100 µA
(3 to 10) A		0.21 % + 2 mA
(10 to 20) A		0.21 % + 5 mA

(16 to 150) A	(45 to 440) Hz	1 % + 0.25 A	Using 50 turn coil
(150 to 1000) A		1 % + 0.9 A
AC Voltage – Generate^{3, 5}

(1 to 330) mV	45 Hz to 10 kHz	0.018 % + 8 µV	Fluke 5522A
(0.330 to 3.3) V	45 Hz to 10 kHz	0.018 % + 60 µV
(3.3 to 33) V	45 Hz to 10 kHz	0.017 % + 0.6 mV

(33 to 330) V	45 Hz to 1 kHz	0.023 % + 2 mV
	(1 to 10) kHz	0.023 % + 6 mV

(330 to 1020) V	45 Hz to 1 kHz	0.046 % + 10 mV
	(1 to 5) kHz	0.040 % + 10 mV
AC Voltage – Measure^{3, 5}

Up to 100 mV	60 Hz to 3 kHz	0.063 % + 40 µV	HP 34401
100 mV to 1 V		0.063 % + 300 µV
(1 to 10) V		0.062 % + 3 mV
(10 to 100) V		0.064 % + 30 mV
(100 to 750) V		0.075 % + 230 mV

Up to 10 kV		0.14 % + 100 mV	Vitrek 4700 w/ HVL-70
Up to 50 kV		0.1 % + 400 mV
Parameter/Equipment	Range	CMC^{2, 7, 13} (±)	Comments
Capacitance – Generate^{3, 5}

Low	(0.22 to 3.3) nF	0.5 % + 10 pF	Fluke 5522A
	(3.3 to 33) nF	0.26 % + 100 pF
	(33 to 330) nF	0.26 % + 300 pF
	(330 to 3300) nF	0.26 % + 3 nF

High	(3.3 to 33) µF	0.4 % + 30 nF
	(33 to 330) µF	0.45 % + 300 nF
	(330 to 3300) µF	0.45 % + 3 µF
	(3.3 to 110) mF	1.1 % + 10 µF
DC Current – Generate3, 5	(0 to 330) µA	0.015 % + 20 nA	Fluke 5522A
	Up to 3.3 mA	0.010 % + 50 nA
	Up to 33 mA	0.014 % + 250 nA
	Up to 330 mA	0.010 % + 2.5 µA
	Up to 3 A	0.038 % + 40 µA
	(1.1 to 11) A	0.050 % + 500 µA
	(11 to 20.5) A	0.1 % + 750 µA

	(10 to 150) A	0.5 % + 0.14 A	Using 50 turn coil
	(150 to 1000) A	0.5 % + 0.5 A
DC Current – Measure^{3, 5}	Up to 10 mA	0.075 % + 6 µA	HP 34401
	(10 to 100) mA	0.051 % + 5 µA
	100 mA to 1 A	0.11 % + 100 µA
	(1 to 3) A	0.13 % + 600 µA
DC Voltage – Generate^{3, 5}	(0 to 330) mV	0.002 % + 1 µV	Fluke 5522A
	Up to 3.3 V	0.0012 % + 2 µV
	Up to 33 V	0.0013 % + 20 µV
	(30 to 330) V	0.0018 % + 0.15 mV
	(100 to 1000) V	0.0019 % + 1.5 mV
DC Voltage – Measure^{3, 5}	Up to 100 mV	0.0054 % + 3.5 µV	HP 34401
	100 mV to 1 V	0.0042 % + 7 µV
	(1 to 10) V	0.0037 % + 50 µV
	(10 to 100) V	0.0048 % + 600 µV
	(100 to 1000) V	0.0049 % + 10 mV

	Up to 10 kV	0.071 % + 30 mV	Vitrek 4700 w/ HVL-70
	Up to 70 kV	0.049 % + 200 mV
Parameter/Equipment	Range	CMC^{2, 13} (±)	Comments
Oscilloscopes3, 5

Square Wave Amplitude			Fluke 5522A
			SC1100
50 Ω at 1 kHz	1 mV to 6.6 V pk-pk	0.34 % + 40 µV
1 MΩ at 1 kHz	1 mv to 130 V pk-pk	0.25 % + 40 µV

DC Voltage Amplitude

50 Ω Load	(0 to ± 6.6) V	0.25 % + 40 µV
1 MΩ Load	(0 to ± 130) V	0.05 % + 40 µV

Level Sine Wave

Frequency	Up to 1100 MHz	2.5 parts × 10⁶

Amplitude	50 kHz Reference	2.8 % + 300 µV
	50 kHz to 100 MHz	4.2 % + 300 µV
	(100 to 300) MHz	4.6 % + 300 µV
	(300 to 600) MHz	6.4 % + 300 µV
	(600 to 1100) MHz	7.4 % + 300 µV

Flatness	50 kHz to 100 MHz	2.7 % + 100 µV
	(100 to 300) MHz	3.0 % + 100 µV
	(300 to 600) MHz	4.6 % + 100 µV
	(600 to 1100) MHz	5.5 % + 100 µV

Time Markers

50 Ω Load	5 s to 50 ms	28 + 1000t µs/s	t = time in seconds
	20 ms to 1 ns	3.2 µs/s

Rise Time – Generate	1 kHz to 2 MHz	120 ps
	(200 to 300) ps

	(2 to 10) MHz	120 ps
	(200 to 300) ps

Electrical Calibration of	(-200 to 1371) °C	0.56 °C	Omega CL27 – Type K
Temperature Controllers^{3, 5}
Parameter/Equipment	Range	CMC^{2, 7, 13} (±)	Comments
Resistance – Generate^{3, 5}	(0 to 330) Ω	0.065 % + 20 mΩ	Fluke 5522A
	(330 to 3300) Ω	0.029 % + 100 mΩ
	(3300 to 33 000) Ω	0.029 % + 1.0 Ω
	(33 to 330) kΩ	0.0037 % + 10 Ω
	(330 to 3300) kΩ	0.0063 % + 150
	(3.3 to 33) MΩ	Ω 0.026 % + 2500 Ω
	(33 to 110) MΩ	0.063 % + 3.0 kΩ
	(110 to 330) MΩ	0.14 % + 100 kΩ
	(330 to 1100) MΩ	0.14 % + 500 kΩ
Resistance – Measure^{3, 5}	Up to 100 Ω	0.066 % + 4 mΩ	HP 34401
	100 Ω to 1 kΩ	0.031 % + 10 mΩ
	(1 to 10) kΩ	0.031 % + 100 mΩ
	(10 to 100) kΩ	0.011 % + 1 Ω
	100 kΩ to 1 MΩ	0.012 % + 10 Ω
	(1 to 10) MΩ	0.048 % + 100 Ω
	(10 to 100) MΩ	0.8 % + 10 kΩ
Electrical Simulation of
RTD^{3, 5}

PT385, 100 Ω	(-200 to 0) °C	0.058 °C	Fluke 5522A
	(0 to 100) °C	0.17 °C
	(100 to 400) °C	0.12 °C
	(400 to 630) °C	0.14 °C
	(630 to 800) °C	0.28 °C

Parameter/Equipment	Range	CMC² (±)	Comments
Electrical Simulation of
Thermocouples and
Indicator^{s3, 5}

Type E	(-250 to -100) °C	0.51 °C	Fluke 5522A
	(-100 to -25) °C	0.16 °C
	(-25 to 350) °C	0.19 °C
	(350 to 650) °C	0.20 °C
	(650 to 1000) °C	0.24 °C

Type J	(-210 to -100) °C	0.28 °C
	(-100 to -30) °C	0.16 °C
	(-30 to 150) °C	0.14 °C
	(150 to 760) °C	0.17 °C
	(760 to 1200) °C	0.23 °C

Type K	(-200 to -100) °C	0.33 °C
	(-100 to -25) °C	0.18 °C
	(-25 to 120) °C	0.20 °C
	(120 to 1000) °C	0.24 °C
	(1000 to 1372) °C	0.40 °C

Type T	(-250 to -150) °C	0.63 °C
	(-150 to 0.0) °C	0.24 °C
	(0.0 to 120) °C	0.16 °C
	(120 to 400) °C	0.14 °C
Welding Devices^{3, 5}	(0 to 350) Amps DC	0.87 ADC	Load bank, current
	(0 to 100) Volts DC	0.012 VDC	shunt, DMM
	(100 to 700) Feed Rate IPM	3.6 IPM

MECHANICAL
Parameter/Equipment	Range	CMC^{2, 9} (±)	Comments
Accelerometers	(5 to 9) Hz	0.021	Back to back
	(10 to 99) Hz	0.013	comparison
	(100 to 1999) Hz	0.015
	(2000 to 10 000) Hz	0.02
	(10 001 to 15 000) Hz	0.025
Parameter/Equipment	Range⁸	CMC^{2, 9, 12} (±)	Comments
Balances^{3, 5}
	(0 to 20) g	0.11 mg	Class 1 weights
	(0 to 200) g	0.69 mg

	(0 to 200) g	1.3 mg	Class 2 weights
	(0 to 1000) g	6.6 mg
	(0 to 5000) g	34 mg

	(0 to 20) g	0.81 mg	Class 4 weights
	(0 to 200) g	4.8 mg
	(0 to 1000) g	24 mg
	(0 to 5000) g	130 mg
	(0 to 10 000) g	370 mg
	(0 to 20 000) g	460 mg
Force – Measuring
Equipment^{3, 5}

Tension/Compression	Up to 100 lbf	0.0064 lbf	Class F weights
			w/ load cells
Compression	(100 to 1000) lbf	0.26 % Indication
	(1000 to 10 000) lbf	0.24 % Indication
	(10 000 to 50 000) lbf	0.33 % Indication
	(10 000 to 100 000) lbf	1.6 % Indication
	(50 000 to 500 000) lbf	0.4 % Indication

Tension	(100 to 1000) lbf	0.23 % Indication
	(1000 to 10 000) lbf	0.23 % Indication
	(10 000 to 50 000) lbf	0.29 % Indication
Mass, Fixed Points	1 mg	2.2 µg	Modified double
	2 mg	2.1 µg	substitution
	5 mg	2.9 µg
	10 mg	1.4 µg
	20 mg	1.5 µg
	30 mg	2.2 µg
	50 mg	1.6 µg
	100 mg	1.7 µg
	200 mg	1.6 µg
	300 mg	1.6 µg
Parameter/Equipment	Range⁸	CMC² (±)	Comments
Mass, Fixed Points (cont)	500 mg	2.1 µg	Modified double
	1 g	11 µg	substitution
	2 g	3.3 µg
	5 g	5.7 µg
	10 g	7.2 µg
	20 g	13 µg
	50 g	11 µg
	100 g	39 µg
	200 g	140 µg
	500 g	320 µg	Direct comparison
	1 kg	390 µg
	2 kg	1.7 mg
	5 kg	2.6 mg

	10 kg	93 mg
	20 kg	94 mg

	0.8859 g (1/32 oz)	12 µg
	1.772 g (1/16 oz)	94 µg
	3.544 g (1/8 oz)	240 µg
	7.087 g (1/4 oz)	170 µg
	14.17 g (1/2 oz)	170 µg
	28.35 g (1 oz)	370 µg
	56.7 g (2 oz)	150 µg
	113.4 g (4 oz)	740 µg
	226.8 g (8 oz)	5.1 mg

	0.4536 g (0.001 lb)	130 µg
	0.9072 g (0.002 lb)	56 µg
	2.27 g (0.005 lb)	26 µg
	4.54 g (0.01 lb)	16 µg
	9.07 g (0.02 lb)	56 µg
	22.68 g (0.05 lb)	79 µg
	45.36 g (0.1 lb)	37 µg
	90.72 g (0.2 lb)	87 µg

	453.6 g (1 lb )	3.8 mg
	907.2 g (2 lb)	7.9 mg
	2267.96 g (5 lb)	8.3 mg
	4535.9 g (10 lb)	7.4 mg
	9071.8 g (20 lb)	94 mg
	22 679.62 g (50 lb)	95 mg
	45 359.237 g (100 lb)	0.43 g
	90 718.475 g (200 lb)	0.43 g
	226 796.185 g (500 lb)	0.45 g
	453 592.37 g (1000 lb)	0.47 g
Parameter/Equipment	Range	CMC^{2, 12} (±)	Comments
Optical Tachometer^{3, 5}	200 FPM	1.3 FPM	Calibrated strobe
	3000 FPM	1.7 FPM
	29 999 FPM	3.9 FPM
Pressure Measuring	(0 to 30 000) psig	43 psig	Additel digital test
Equipment – Gages,			gauge
Transducers and
Transmitters^{3, 5}	(0 to 10 000) psig	12 psig	Crystal XP2 digital
	(0 to 3000) psig	3.8 psig	test gauge

	(0 to 5000) psig	3.9 psig	Druck/Martel
	(0 to 300) psig	0.18 psig	transducer

	(0 to 2) in H2O	0.0026 in H2O	Dwyer hook gage

	(0 to 300) psig	0.04 psig	GE/Pace 1003
	(0 to 3000) psig	0.38 psig
	(0 to 10 000) psig	1.3 psig
Scales^{3, 5}	(0 to 10) lb	0.000 25 lb	Class 4 weights
	(0 to 20) lb	0.000 25 lb

	(0 to 50) lb	0.0063 lb	Class F weights
	(0 to 100) lb	0.0063 lb
	(0 to 200) lb	0.0064 lb
	(0 to 500) lb	0.0064 lb
	(0 to 1000) lb	0.18 lb
	(0 to 5000) lb	0.19 lb
	(0 to 20 000) lb	0.21 lb
Torque Wrenches –	(10 to 50) in•lbf	0.17 in•lbf	CDI/Norbar torque
Measure^{3, 5}	(30 to 400) in•lbf	1.8 in•lbf	calibrator
	(80 to 1000) in•lbf	5.1 in•lbf
	(240 to 3000) in•lbf	21 in•lbf

	(1200 to 6000) in•lbf	23 in•lbf	Norbar torque
	(2400 to 12 000) in•lbf	58 in•lbf	calibrator
Parameter/Equipment	Range	CMC^{2, 9, 12} (±)	Comments
Torque Measuring	Up to 200 in•lbf	0.001	Torque arm and
Equipment – Transducers	Up to 1200 in•lbf	0.00091	weights
	Up to 12 000 in•lbf	0.001
Vacuum Measuring	(0 to 15) psig	0.03 psig	Druck DPI 610
Equipment – Gauges^{3, 5}
Rotations Speed –	Contact:
Measurement^{3, 5}	Up to 200 RPM	1.5 RPM	Monarch PLT200
	(200 to 3000) RPM	2.4 RPM
	(3000 to 20 000) RPM	11 RPM

	Optical:
	Up to 3000 RPM	1.3 RPM
	(3000 to 30 000) RPM	3.3 RPM
Indirect Verification of	HRB:
Rockwell Hardness	Low	1.0 HRB	Indirect verification
Testers^3,5	Medium	0.65 HRB
	High	0.49 HRB

	HRC:
	Low	0.45 HRC
	Medium	0.36 HRC
	High	0.37 HRC
Indirect Verification of	HBW 10/500:		Indirect verification
Brinell Hardness	Low	4.0 HBW
Testers^3,5
	HBW 10/3000:
	High	4.8 HBW

FLUID QUANTITIES
Parameter/Equipment	Range	CMC^{2, 9} (±)	Comments
Pipettes^{3, 5}	(1 to 50) µL	0.31 µL	Gravimetric method
	(50 to 100) µL	0.6 µL
	(100 to 500) µL	1.3 µL
	(500 to 1000) µL	2.2 µL
	(1000 to 5000) µL	12 µL
	(5000 to 10 000) µL	18 µL

THERMODYNAMIC
Parameter/Equipment	Range	CMC^{2, 12} (±)	Comments
Temperature – Measuring	(30 to 300) °C	0.09 °C	Hart 1502A/5614
Equipment^{3, 5}	(86 to 572) °F	0.16 °F	PRT in dry block
Temperature – Measuring	(-40 to 200) °C	0.061 °C	Hart 1502A/5614
Equipment	(-40 to 392) °F	0.11 °F	PRT in wet bath, in
			lab only
Temperature –Measure^{3, 5}	(-100 to 600) °C	0.64 °C	Fluke 51 with
	(-148 to 1112) °F	1.2 °F	thermocouple

	(600 to 1200) °C	1.1 °C
	(1112 to 2192) °F	2.0 °F
IR Thermometer^3,5	(-20 to 150) °C	1.1 °C	Mikron M340 (lab
			only)

	(Amb + 10 to 400) °C	2.1 °C	Omega BB703

			Emissivity ≈ 0.95
			Wavelength
			(8 to 14) µm
Humidity – Measure &	(10 to 90) % RH	3.4 % RH	Sensor Scientific
Measuring Equipment^{3, 5}			B13-200

TIME & FREQUENCY
Parameter/Equipment	Range	CMC^{2, 7, 9, 12} (±)	Comments
Frequency – Measure^{3, 5}	40 Hz to 300 kHz	0.014 % Indication	HP 34401
Timers and Stopwatches^{3, 5}	Up to 24 hr	0.84 s/24 hr	Reference stopwatch
Stroboscopes^{3, 5}	Up to 3600 FPM	0.11 FPM	Universal counter
	Up to 30 000 FPM	0.72 FPM

¹ This laboratory offers commercial calibration service and field calibration service.

² Calibration and Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement that a laboratory can achieve within its scope of accreditation when performing more or less routine calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. Calibration and Measurement Capabilities represent expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory may be greater than the CMC due to the behavior of the customer’s device and to influences from the circumstances of the specific calibration.

³ Field calibration service is available for this calibration and this laboratory meets A2LA R104 – General Requirements: Accreditation of Field Testing and Field Calibration Laboratories for these calibrations. Please note the actual measurement uncertainties achievable on a customer's site can normally be expected to be larger than the CMC found on the A2LA Scope. Allowance must be made for aspects such as the environment at the place of calibration and for other possible adverse effects such as those caused by transportation of the calibration equipment. The usual allowance for the actual uncertainty introduced by the item being calibrated, (e.g. resolution, repeatability) must also be considered and this, on its own, could result in the actual measurement uncertainty achievable on a customer’s site being larger than the CMC.

⁴ In the statement of CMC, L is the numerical value of the nominal length of the device measured in inches and R is the numerical value of the resolution of the device in microinches unless otherwise noted.

⁵ The CMC stated for calibrations performed in the laboratory is applicable for calibrations performed in the field.

⁶ CMC for the Wavetek 9100A is based on 1-year specifications within a temperature range of 23 °C ± 5 °C. Field calibrations will be performed within 23 °C ± 5 °C.

⁷ CMC for the HP 34401 is based on 1-year specifications within a temperature range of 18 °C to 28 °C. Field calibrations will be performed within 18 °C to 28 °C, 30 % to 55 % humidity.

⁸ Where ranges are not specified, the CMC stated is for the cardinal points only.

⁹ In the statement of CMC, percentage (%) refers to percent of reading, unless otherwise noted.

¹⁰ "SuperMic" is a registered trade mark with a last listed owner of Pratt & Whitney Measurement Systems, Inc., Connecticut U.S.A.

(A2LA Cert. No. 1509.01) Revised 5/20/2016

This is a marketing version of the official A2LA Scope of Accreditation. It has been modified from the official version to contain the logo of the accredited organization and this modification has been approved by A2LA. The content of the Scope itself has not been altered. The official version of the Scope of Accreditation may be found at: https://www.a2la.org/scopepdf/1509-01.pdf

Service Request

What can we help with?

Calibration

Repair

Sales

Systems

Rentals

Accreditation

A2LA Accreditation

Dallas, TX Lab - A2LA Accreditation

SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017 & ANSI/NCSL Z540-1-1994

DIMENSIONAL

ELECTRICAL - DC/Low Frequency

MECHANICAL

FLUID QUANTITIES

THERMODYNAMIC

TIME & FREQUENCY

Service Request